Hailan Microelectronics
HLW2001S
Not specified in radiation table · Radiation-tolerant circuits
Selection details
HLW2001S is a radiation-tolerant temperature-compensated negative gate-bias driver listed in Hailan's 2026 V2 selection guide. The values below retain the model and format identified in the guide.
Selection-guide values support initial evaluation. Obtain the exact model datasheet and operating limits before design qualification.
TID is a manufacturer guide claim only. Test method, dose rate, bias conditions and independent qualification are not supplied; no space/military certification is claimed.
- Manufacturer
- Wuxi Hailan Microelectronics Technology Co., Ltd
- Record type
- Not specified in radiation table
- Original designation
- HLW2001S
- LANGOM enquiry reference
- LAG-HL-HLW2001S
- Total ionizing dose, guide-listed
- 20 krad(Si)
Source: Hailan Product Selection Guide, 2026 V2 · page 9
LAG codes are LANGOM enquiry references. They do not replace manufacturer part numbers or establish interchangeability.
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